Effects of modelling detail on simulated potential crop yields under a wide range of climatic conditions


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Authors: Adam, M.; Van Bussel, L.G.J.; Leffelaar, P.A.; Van Keulen, H.; Ewert, F.
Subjects: crop growth stage, radiation use efficiency
Publication type: ISI, Journal Article, Publication
Year: 2011
ISSN: 0304-3800

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